JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, cilt.292, sa.2, ss.467-472, 2012 (SCI-Expanded)
The chemical shifts and full widths at half maximum intensity of La X-ray emission lines of elements in the range 26 <= Z <= 30 were studied in their halogen compounds using a wavelength-dispersive X-ray fluorescence spectrometry. It was observed that the chemical shifts for F based compounds are higher than that of Cl and Br based compounds.