Design Improvements with Temperature-Rise Tests and Analysis in Disconnectors


Creative Commons License

Özbek A., Kılıc O., Ocak A., Düzkaya H., Tezcan S. S.

2024 11th International Conference on Electrical and Electronics Engineering (ICEEE), Muğla, Türkiye, 22 - 24 Nisan 2024, ss.12-15

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Doi Numarası: 10.1109/iceee62185.2024.10779303
  • Basıldığı Şehir: Muğla
  • Basıldığı Ülke: Türkiye
  • Sayfa Sayıları: ss.12-15
  • Gazi Üniversitesi Adresli: Evet

Özet

In medium and high-voltage systems, disconnectors are switchgear devices that can open and close when the circuit is unloaded and create a visible separation gap in the open position. One of the most critical tests performed on disconnectors is the temperature-rise test. The requirements of the EC 62271–1 standard are met during the application of this test on load-switching disconnectors. This study examines the temperature-rise test results of these disconnectors, which can operate up to 2500A rated voltage currents at 36 kV rated voltage level for up to 480 minutes. This study reveals how the temperature-rise tests are performed and the design improvements made to pass this test.