Growth and characterization of AlGaAs/GaAs quantum well infrared photodetectors
Optoelectronics and Advanced Materials, Rapid Communications, cilt.4, sa.2, ss.132-135, 2010 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 4 Sayı: 2
- Basım Tarihi: 2010
- Dergi Adı: Optoelectronics and Advanced Materials, Rapid Communications
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.132-135
- Gazi Üniversitesi Adresli: Evet
Özet
Two AlGaAs/GaAs quantum well infrared photodetectors (QWIPs) were grown using molecular beam epitaxy (MBE) with continues growth method. One of them has bound-to-bound transition (B-T-B) QWIP and the other has bound-to-continuum transition (B-T-C) QWIP. The structural properties of the QWIPs were characterized by high-resolution x-ray diffraction (HRXRD) and optical properties were characterized by photoluminescence (PL) measurements. Also dark current measurements of the QWIPs were performed at low temperature and show that the B-T-C QWIP has lower dark current level than B-T-B QWIP due to reducing the carrier tunneling.