A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

Yucel, H.; Birgul, O.; Uyar, ESRA; Cubukcu, S.

doi:10.1016/j.net.2018.12.024

A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

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Yucel H., Birgul O., Uyar E. , Cubukcu S.

NUCLEAR ENGINEERING AND TECHNOLOGY, vol.51, no.3, pp.731-737, 2019 (Journal Indexed in SCI)

Publication Type: Article / Article
Volume: 51 Issue: 3
Publication Date: 2019
Doi Number: 10.1016/j.net.2018.12.024
Title of Journal : NUCLEAR ENGINEERING AND TECHNOLOGY
Page Numbers: pp.731-737

Abstract

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (mu(e)) and electron mobilitylifetime product (mu tau)(e) in a CdZnTe detector.