A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

Yucel H., Birgul O., Uyar E., Cubukcu S.

NUCLEAR ENGINEERING AND TECHNOLOGY, vol.51, no.3, pp.731-737, 2019 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 51 Issue: 3
  • Publication Date: 2019
  • Doi Number: 10.1016/j.net.2018.12.024
  • Journal Name: NUCLEAR ENGINEERING AND TECHNOLOGY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.731-737
  • Keywords: CdZnTe, Electron mobility, Mobility-lifetime product, Transient pulse, Rise time, Charge Carrier, Digital pulse processing, PERFORMANCE, TIME
  • Gazi University Affiliated: Yes

Abstract

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (mu(e)) and electron mobilitylifetime product (mu tau)(e) in a CdZnTe detector.