A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors


Yucel H., Birgul O., Uyar E. , Cubukcu S.

NUCLEAR ENGINEERING AND TECHNOLOGY, cilt.51, sa.3, ss.731-737, 2019 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 51 Konu: 3
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1016/j.net.2018.12.024
  • Dergi Adı: NUCLEAR ENGINEERING AND TECHNOLOGY
  • Sayfa Sayıları: ss.731-737

Özet

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (mu(e)) and electron mobilitylifetime product (mu tau)(e) in a CdZnTe detector.