A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

Yucel, H.; Birgul, O.; Uyar, ESRA; Cubukcu, S.

doi:10.1016/j.net.2018.12.024

A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

Atıf İçin Kopyala

Yucel H., Birgul O., Uyar E. , Cubukcu S.

NUCLEAR ENGINEERING AND TECHNOLOGY, cilt.51, sa.3, ss.731-737, 2019 (SCI İndekslerine Giren Dergi)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 51 Konu: 3
Basım Tarihi: 2019
Doi Numarası: 10.1016/j.net.2018.12.024
Dergi Adı: NUCLEAR ENGINEERING AND TECHNOLOGY
Sayfa Sayıları: ss.731-737

Özet

In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (mu(e)) and electron mobilitylifetime product (mu tau)(e) in a CdZnTe detector.