On the Frequency and Voltage Dependence of Dielectric Properties and ElectricModulus in Al/Bi4Ti3O12/n-Si (MFS) Capacitors by Using Impedance SpectroscopyMethod


DURMUŞ P. , BİLKAN Ç., ALTINDAL Ş. , DÖKME İ.

4th Internatıonal conference on materials science and nanotechnology for next generation, 28 - 30 Haziran 2017

  • Yayın Türü: Bildiri / Özet Bildiri