Gaussian source beam diffraction by a perfect electromagnetic half-plane

Basdemir H. D.

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, cilt.37, sa.6, ss.930-939, 2020 (SCI-Expanded) identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 37 Sayı: 6
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1364/josaa.389239
  • Dergi Adı: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Communication Abstracts, Compendex, Computer & Applied Sciences, EMBASE, MEDLINE, zbMATH
  • Sayfa Sayıları: ss.930-939
  • Gazi Üniversitesi Adresli: Hayır

Özet

In the present work, diffraction of a Gaussian source beam by a perfect electromagnetic conductor (PEMC) semi-screen is investigated. Due to the special property of the PEMC sheet, which is a combination of perfect electric conductor and perfect magnetic conductor surfaces, the reflected wave from the PEMC surface has a cross-polarized component in addition to the co-polarized component. For an electric line source illumination, the diffracted fields are derived by considering the analogy between the transition boundaries and scattered geometric optics fields. Later, the complex point source technique is applied for evaluation of Gaussian beam diffraction. The finite magnitude values of fields are derived with the aid of an improved version of the well-known uniform theory of diffraction for evanescent plane waves. Also, the resultant waves are plotted and discussed for different groups of parameters. (c) 2020 Optical Society of America