On the forward bias negative capacitance and interface traps Dit and series resistance Rs effects in Cr p Si MS contacts with and without PPy interfacial layer at room temperature

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BİLKAN Ç., GÜMÜŞ A., BİLKAN M. T., ALTINDAL Ş.

2nd International Nanoscience and Nanotechnolgy for Next Generation Conference (NaNoNG) 2015, 29 - 31 Ekim 2015

• Yayın Türü: Bildiri
• Gazi Üniversitesi Adresli: Evet