On the forward bias negative capacitance and interface traps Dit and series resistance Rs effects in Cr p Si MS contacts with and without PPy interfacial layer at room temperature

BİLKAN Ç., GÜMÜŞ A., BİLKAN M. T., ALTINDAL Ş.

2nd International Nanoscience and Nanotechnolgy for Next Generation Conference (NaNoNG) 2015, 29 - 31 Ekim 2015

  • Yayın Türü: Bildiri
  • Gazi Üniversitesi Adresli: Evet