Akademik Veri Yönetim Sistemi
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, cilt.74, 2025 (SCI-Expanded, Scopus)
This study developed a portable, wireless, and low-cost measurement system to perform current-voltage (I - V) characterization of two-terminal electronic components, particularly memristors. The proposed system was designed as an embedded hardware and software platform capable of high-precision I - V measurements. The system offers significant advantages over existing measurement setups due to its compactness with Li-ion battery power supply, Bluetooth communication capability, and the MATLAB GUI-based user interface. The performance of the system was investigated by comparing it with a widely used sourcemeter. For the testing phase of the system, the Ag/ZnO/ITO memristor structure with ZnO layer produced by sputtering method and the top electrode produced by thermal evaporation were used. The active layer of the memristor was characterized using atomic force microscopy (AFM) and Raman spectroscopy. The I - V measurements were carried out using the developed system on the Ag/ZnO/ITO memristor structure and a rectifier diode. The results demonstrated a high level of compatibility with those obtained from commercial systems. The analyses conducted for measurement precision, stability and accuracy indicate that the proposed system can be a reliable characterization tool for memristors and other two-terminal electronic components. The I - V measurement system offers an alternative solution to traditional commercial measurement devices due to the advantages of portability, low power consumption, low cost, and wireless use.