Akademik Veri Yönetim Sistemi
IEEE Transactions on Instrumentation and Measurement, 2025 (SCI-Expanded, Scopus)
This study developed a portable, wireless, and low-cost measurement system to perform current-voltage (I-V) characterization of two-terminal electronic components, particularly memristors. The proposed system was designed as an embedded hardware and software platform capable of high-precision I-V measurements. The system offers significant advantages over existing measurement setups due to its compactness with Li-ion battery power supply, Bluetooth communication capability, and a MATLAB GUI-based user interface. The performance of the system was investigated by comparing it with a widely used sourcemeter. For the testing phase of the system, Ag/ZnO/ITO memristor structure with ZnO layer produced by sputtering method and a top electrode produced by thermal evaporation was used. The active layer of the memristor was characterized using Atomic Force Microscopy (AFM) and Raman spectroscopy. I-V measurements were carried out using the developed system on the Ag/ZnO/ITO memristor structure and a rectifier diode. The results demonstrated a high level of compatibility with those obtained from commercial systems. The analyses conducted for measurement precision, stability and accuracy indicate that the proposed system can be a reliable characterization tool for memristors and other two terminal electronic components. The current-voltage measurement system offers an alternative solution to traditional commercial measurement devices due to the advantages of portability, low power consumption, low cost and wireless use.