Investigation of Radiation Shielding Parameters of Tantalum Oxide Containing Bismuth Oxide Material
Gazi University Journal of Science Part A: Engineering and Innovation, cilt.13, sa.2, ss.849-864, 2026 (TRDizin)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 13 Sayı: 2
- Basım Tarihi: 2026
- Doi Numarası: 10.54287/gujsa.1969621
- Dergi Adı: Gazi University Journal of Science Part A: Engineering and Innovation
- Derginin Tarandığı İndeksler: TR DİZİN (ULAKBİM)
- Sayfa Sayıları: ss.849-864
- Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
- Gazi Üniversitesi Adresli: Evet
Özet
This study theoretically investigates the radiation shielding performance of epoxy-based composites containing different fractions of bismuth oxide and tantalum oxide as lead-free alternatives. Three composite samples were analyzed using Phy-X/PSD software for photon energies from 1 keV to 105 keV. Results Show that tantalum oxide significantly enhances shielding performance in the medium energy range (70-90 keV) due to tantalum’s K-absorption edge at ~67.4 keV, increasing photoelectric interaction probaility. Hybrid composites exhibit broader spectrum shielding compared to single-additive metarials. These epoxy, tantalum oxide and bismuth oxide composite present a promising alternative for portable radiation protection systems and medical imaging devices requiring lead-free shielding materials.