Load-dependent nanoindentation response of NaBi(MoO(Formula presented) (Formula presented))(Formula presented) (Formula presented)single crystals: PSR analysis and energy dissipation
Physica Scripta, cilt.101, sa.33, 2026 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 101 Sayı: 33
- Basım Tarihi: 2026
- Doi Numarası: 10.1088/1402-4896/ae97c2
- Dergi Adı: Physica Scripta
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Chemical Abstracts Core, Compendex, INSPEC, zbMATH
- Anahtar Kelimeler: energy dissipation, indentation size effect, NaBi(MoO4)2single crystal, nanoindentation, proportional specimen resistance model, Young’s modulus
- Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
- Gazi Üniversitesi Adresli: Evet
Özet
In the present study, NaBi(MoO (Formula presented) (Formula presented) ) (Formula presented) (Formula presented) single crystals grown by the Czochralski method were systematically investigated through structural characterization and depth-sensing nanoindentation. X-ray diffraction confirmed phase purity and tetragonal symmetry, while Williamson–Hall analysis provided complementary insight into crystallite-scale strain and defect-related broadening. Load-dependent nanoindentation measurements were evaluated using Oliver–Pharr analysis together with proportional specimen resistance and Meyer-based approaches to distinguish apparent indentation effects from intrinsic mechanical behavior. The results reveal a clear indentation size effect, a progressive decrease in apparent hardness/modulus-related indicators with increasing load, and a concurrent shift in energy partition from elastic to plastic contribution, consistent with increasing irreversible deformation at higher contact loads. By combining crystallographic, mechanical, and energetic analyses within a single framework, this work delivers a reliable property map for NaBi(MoO (Formula presented) (Formula presented) ) (Formula presented) (Formula presented) and provides practical guidance for its use in load-sensitive photonic, optoelectronic, and functional oxide applications where mechanical reliability is critical.