Educational material development model for teaching computer network and system management


YALÇIN N., Altun Y., KÖSE U.

COMPUTER APPLICATIONS IN ENGINEERING EDUCATION, cilt.23, sa.4, ss.621-629, 2015 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 23 Sayı: 4
  • Basım Tarihi: 2015
  • Doi Numarası: 10.1002/cae.21636
  • Dergi Adı: COMPUTER APPLICATIONS IN ENGINEERING EDUCATION
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.621-629
  • Anahtar Kelimeler: computer networks education, virtualization, applications in subject areas, improving classroom teaching, simulations, distance education, TOOL
  • Gazi Üniversitesi Adresli: Evet

Özet

Computer network and system management education is often structured based on theoretical information and it is not considered effective and efficient due to various reasons such as inadequacy of available materials and hardware. In addition, investors are reluctant to make investments on the provision of educational materials due to relatively high cost specific to this field. However, recent developments in virtualization technologies have led to the emergence of new trends in computer network and system management education. This paper provides information about the use of virtualization technology in computer network education, the utilization of real network devices, and defines a new generation network training platform. The aim of the study is to offer a new model using virtualization technology for network-based computer education. The topology additionally proposed here involves the use of real hardware instead of virtual ones, which distinguishes it from the similar topologies. This model is expected to guide future network and system managers to develop and use a real network and system management training platform that is far more effective than simulation programs. (c) 2015 Wiley Periodicals, Inc. Comput Appl Eng Educ 23:621-629, 2015; View this article online at ; DOI