The characteristic evolution of TiO2/Al2O3 bilayer films produced by ALD: Effect of substrate type and wide range annealing temperature

POLAT GÖNÜLLÜ M., ATEŞ H.

SUPERLATTICES AND MICROSTRUCTURES, cilt.142, 2020 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 142
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1016/j.spmi.2020.106529
  • Dergi Adı: SUPERLATTICES AND MICROSTRUCTURES
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Anahtar Kelimeler: TiO2/Al2O3, Bilayer thin film, ALD, Phase transformation, Mixed phase, Characterization, ATOMIC LAYER DEPOSITION, TIO2 THIN-FILMS, BAND-GAP, PHOTOCATALYTIC ACTIVITY, RAMAN-SPECTRA, LASER DAMAGE, SOL-GEL, AL2O3, GROWTH
  • Gazi Üniversitesi Adresli: Evet

Özet

Single bilayer (1BL) of TiO2/Al2O3 nanolaminate films were grown on n-Si (100) and glass substrates via Atomic Layer Deposition technique. Films were deposited using tetrakis (dimethylamino)titanium(IV), trimethylaluminum and water vapor as precursors at a reactor temperature of 200 degrees C. Post deposition annealing was performed on the grown nanolaminate films in a wide variable temperature range (300-1100 degrees C) to investigate evolution of crystal properties in detail. The films were studied with grazing incidence X-ray diffraction (GIXRD), atomic force microscopy (AFM), and UV-Vis spectroscopy. Crystal structures of the films revealed different combinations of three phases that belong to TiO2. Phase transformations of TiO2 and Al2O3 were determined as a result of annealing. Atomic force microscopy images together with roughness values of TiO2/Al2O3 nanolaminate films showed a trend associated with crystal structure changes. Optical measurements revealed that the indirect band gap of films which produced on glass substrate decreased with respect to bulk TiO2 and prior reports.