Dielectric properties of Ag/Ru-0.03-PVA/n-Si structures
BULLETIN OF MATERIALS SCIENCE, vol.42, no.5, 2019 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 42 Issue: 5
- Publication Date: 2019
- Doi Number: 10.1007/s12034-019-1875-4
- Journal Name: BULLETIN OF MATERIALS SCIENCE
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Keywords: Ag/Ru-0.03-PVA/n-Si, impedance spectroscopy, frequency dependence, surface states, AC ELECTRICAL-CONDUCTIVITY, IONIC-LAYER ADSORPTION, THIN-FILMS, SPECTROSCOPY, RELAXATION, FREQUENCY, RU
- Open Archive Collection: AVESIS Open Access Collection
- Gazi University Affiliated: Yes
Abstract
Ag/Ru-0.03-PVA/n-Si structures were successfully prepared and their morphological and electrical properties were investigated. The obtained electrical results suggested that the complex dielectric constant (epsilon* = epsilon'-j epsilon ''), complex electric modulus M* = M' + jM ''', loss tangent (tan delta) and alternating current (ac) electrical conductivity (sigma(ac)) are all a strong function of the frequency (f) and applied voltage. The changes in these parameters are the results of the existence of the surface states (N-ss) or interface traps (D-it = N-ss), interfacial polymer layer, surface and dipole polarizations and hopping mechanisms. The values of epsilon' and epsilon '' show a steep decline with increasing frequency and then reach a constant value at high frequency, whereas the increments of M' and M '' with frequency are exponential. The tan delta vs. log f plot has a strong peak behaviour, especially in the accumulation region. These experimental results suggested that the Ru-0.03-PVA interfacial layer could be used as a high dielectric material instead of conventional materials.