Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

Balantekin M. , Atalar A.

APPLIED PHYSICS LETTERS, cilt.87, sa.24, 2005 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 87 Konu: 24
  • Basım Tarihi: 2005
  • Doi Numarası: 10.1063/1.2147708


Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials' nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio.