Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction | AVESİS

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Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction

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FİZİKA, vol.1, pp.179-183, 2008 (Peer-Reviewed Journal)

Publication Type: Article / Article
Volume: 1
Publication Date: 2008
Journal Name: FİZİKA
Page Numbers: pp.179-183
Gazi University Affiliated: No