HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications


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Bayal Ö., Bilgili A. K., Kaya N., Öztürk M. K., Kalaycı Ş.

Gazi University Journal of Science Part A: Engineering and Innovation, cilt.11, sa.2, ss.264-273, 2024 (Hakemli Dergi) identifier