The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device

YÜKSELTÜRK E., BENGİ S., BÜLBÜL M. M.

5th International Conference on Materials Science and Nanotechnology for Next Generation, 4 - 06 Ekim 2018

  • Yayın Türü: Bildiri / Özet Bildiri
  • Gazi Üniversitesi Adresli: Evet