The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device


YÜKSELTÜRK E., BENGİ S., BÜLBÜL M. M.

5th International Conference on Materials Science and Nanotechnology for Next Generation, 4 - 06 October 2018

  • Publication Type: Conference Paper / Summary Text
  • Gazi University Affiliated: Yes