Analyze of Defects in InGaAs epilayer with High resolution X ray diffraction


Lişesivdin B.

FİZİKA, vol.1, pp.179-183, 2008 (Refereed Journals of Other Institutions)

  • Publication Type: Article / Article
  • Volume: 1
  • Publication Date: 2008
  • Title of Journal : FİZİKA
  • Page Numbers: pp.179-183