Analysis of the structural and optical characteristics of ZnSe thin flms as interface layer

Emir C., Tataroğlu A., Gökmen U., Bilge Ocak S.

JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS, cilt.36, sa.168, ss.1-12, 2025 (SCI-Expanded, Scopus)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 36 Sayı: 168
  • Basım Tarihi: 2025
  • Doi Numarası: 10.1007/s10854-025-14221-3
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, MEDLINE, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.1-12
  • Gazi Üniversitesi Adresli: Evet