The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions | AVESİS

Gazi Üniversitesi Akademik Veri Yönetim Sistemi

The Energy Density Distribution Profile of Interface Traps and Their Relaxation times and Capture Cross Sections of MS structure with GO doped PBCoO nanoceramic Structure in Forward and Reverse Bias Regions

Atıf İçin Kopyala

ALTINDAL Ş., KAYA A., Demirezen S., USLU İ.

1st İnternational Conference on Organic Electronic Material Texchnologies (OEMT'2015) 25-28 Marsch 2015, Elazığ, Türkiye, 25 - 28 Mart 2015, ss.140

Yayın Türü: Bildiri / Özet Bildiri
Basıldığı Şehir: Elazığ
Basıldığı Ülke: Türkiye
Sayfa Sayıları: ss.140
Gazi Üniversitesi Adresli: Evet