Characterization of the CoFe2O4/Cu displacement effect in the Y123 superconductor matrix on critical properties


Safran S., Bulut F., A. R. A. Nefrow A. R. A., Ada H., Öztürk Ö.

JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS, cilt.31, ss.20578-20588, 2020 (SCI-Expanded)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 31
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1007/s10854-020-04578-y
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.20578-20588
  • Gazi Üniversitesi Adresli: Hayır