Investigation of Terp-Pyr/p-Si diode using complex impedance spectroscopy depending on measurement temperatures and frequencies

Oruç P., Tuğluoğlu N., Eymur S.

JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS, cilt.35, sa.314, ss.1-13, 2024 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 314
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1007/s10854-024-12029-1
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, MEDLINE, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.1-13
  • Gazi Üniversitesi Adresli: Evet