HR-XRD and AFM analysis of AlN/SiC structures for optoelectronic device applications


Bayal Ö., Bilgili A. K., KAYA N., ÖZTÜRK M. K., KALAYCI Ş.

Gazi University Journal of Science Part A: Engineering and Innovation, cilt.11, sa.2, ss.264-273, 2024 (Hakemli Dergi) identifier