Dielectric Properties of MOS Device Based on TiO2/SiO2 Oxide Layer


CETIN S. Ş. , EFKERE H. İ. , SERTEL T., TATAROĞLU A. , ÖZÇELİK S.

Seventh Bozok Science Workshop: Boron and Boron Containing Nanomaterials with Applications, 8 - 10 Ağustos 2018