Published journal articles indexed by SCI, SSCI, and AHCI
Refereed Congress / Symposium Publications in Proceedings
High speed imaging in tapping mode atomic force microscopy
IVC-19/ICSS-15 & ICN+T 2013, France, 9 - 13 September 2013
High speed operating method for tapping mode atomic force microscopes with regular cantilevers
15th International Scanning Probe Microscopy Conference, 30 June - 03 July 2013
High speed imaging in noncontact atomic force microscopy
Nanotech 2013, United States Of America, 12 - 16 May 2013, pp.1-4
Real time Topography and Mechanical Property Mapping of Soft Materials by FIRAT using Actively Controlled Transient Tap Forces
MRS Spring Meeting, 14 - 17 April 2009
Optimizing the Driving Scheme of the FIRAT probe for High speed Operation
International Conference on Nanoscience and Technology, United States Of America, 20 - 25 July 2008
Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization
Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition, Hong Kong, 3 - 05 June 2008
Analysis of Dual electrode CMUT Designs for Improved Operation and Performance
International Workshop on Mi-cromachined Ultrasonic Transducers, Norway, 8 - 09 May 2008
Simulation of Large Signal Operation of Capacitive Micromachined Ultrasonic Transducers
International Workshop on Micromachined Ultra-sonic Transducers, Norway, 8 - 09 May 2008
Novel AFM Probes for Fast Imaging and Quantitative Material Characterization
MRS Fall Meeting, United States Of America, 26 - 30 November 2007
Multiple Annular Ring Capacitive Micromachined Ultrasonic Transducer Arrays for Forward Looking Intravascular Ultrasound Imaging Catheters
ASME International Mechanical Engineering Congress and Exposition, United States Of America, 11 - 15 November 2007, pp.179-180
Design Optimization and Integrated Electronics for Dual Electrode CMUTs
2007 IEEE Ultrasonics Symposium, United States Of America, 28 - 31 October 2007
A Fast AFM Probe with Integrated Interferometric Sensing and Electrostatic Actuation
ECS Meeting, United States Of America, 7 - 12 October 2007
Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe
International Symposium on Acoustical Imaging, Japan, 15 - 18 April 2007, vol.29, pp.215-222
AFM Probe Structures with Integrated Interferometric Sensing and Electrostatic Actuation
Kanazawa Workshop on Atomic Force Microscopy, Japan, 12 - 18 January 2007
Extracting and Mapping Nanoscale Material PropertieswithTRIF mode using FIRAT probe
International Conference on Nanoscience and Technology, Switzerland, 31 July - 04 August 2006
An Active Membrane Based Probe Structure for Tapping Mode Atomic Force Microscope Imaging
International Conference on Nanoscience and Technology, Switzerland, 31 July - 04 August 2006
Analysis and Design of Dual Electrode CMUTs
2005 IEEE International Ultrasonics Symposium, Netherlands, 18 - 21 September 2005, pp.581-584
Mapping Nanoscale Material Elasticity using Higher Harmonics of a Tapping Cantilever
ESF Nanotribology Workshop, Turkey, 20 - 23 October 2003
Imaging Material Elasticity with Atomic Force Microscope
Scanning Probe Microscopy, Sensors and Nanostructures, United Kingdom, 23 - 26 May 2003