Publications & Works

Published journal articles indexed by SCI, SSCI, and AHCI

Refereed Congress / Symposium Publications in Proceedings

High speed imaging in tapping mode atomic force microscopy

IVC-19/ICSS-15 & ICN+T 2013, France, 9 - 13 September 2013

High speed operating method for tapping mode atomic force microscopes with regular cantilevers

15th International Scanning Probe Microscopy Conference, 30 June - 03 July 2013

High speed imaging in noncontact atomic force microscopy

Nanotech 2013, United States Of America, 12 - 16 May 2013, pp.1-4

Evaluation of CMUT Annular Arrays for Side Looking IVUS

2009 IEEE International Ultrasonics Symposium, 19 - 23 September 2009, pp.2774-2777

Accurate modeling of capacitive micromachined ultrasonic transducers in pulse echo operation

2008 IEEE Ultrasonics Symposium, Beijing, China, 2 - 05 November 2008, pp.2107-2110

Optimizing the Driving Scheme of the FIRAT probe for High speed Operation

International Conference on Nanoscience and Technology, United States Of America, 20 - 25 July 2008

Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization

Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition, Hong Kong, 3 - 05 June 2008

Simulation of Large Signal Operation of Capacitive Micromachined Ultrasonic Transducers

International Workshop on Micromachined Ultra-sonic Transducers, Norway, 8 - 09 May 2008

Forward Looking IVUS Imaging Using a Dual Annular Ring CMUT Array Experimental Results

2007 IEEE Ultrasonics Symposium, New York, United States Of America, 28 - 31 October 2007, pp.1247-1250

Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe

International Symposium on Acoustical Imaging, Japan, 15 - 18 April 2007, vol.29, pp.215-222

Extracting and Mapping Nanoscale Material PropertieswithTRIF mode using FIRAT probe

International Conference on Nanoscience and Technology, Switzerland, 31 July - 04 August 2006

An Active Membrane Based Probe Structure for Tapping Mode Atomic Force Microscope Imaging

International Conference on Nanoscience and Technology, Switzerland, 31 July - 04 August 2006

Analysis and Design of Dual Electrode CMUTs

2005 IEEE International Ultrasonics Symposium, Netherlands, 18 - 21 September 2005, pp.581-584

Imaging Material Elasticity with Atomic Force Microscope

Scanning Probe Microscopy, Sensors and Nanostructures, United Kingdom, 23 - 26 May 2003




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