Yayınlar & Eserler

SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler

Manipulating the frequency response of small high-frequency atomic force microscope cantilevers

MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.31, sa.9, 2020 (SCI İndekslerine Giren Dergi) identifier identifier

Characterization of dual-electrode CMUTs: Demonstration of improved receive performance and pulse echo operation with dynamic membrane shaping

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, cilt.55, sa.10, ss.2336-2344, 2008 (SCI İndekslerine Giren Dergi) identifier identifier identifier

A new atomic force microscope probe with force sensing integrated readout and active tip

REVIEW OF SCIENTIFIC INSTRUMENTS, cilt.77, sa.2, 2006 (SCI İndekslerine Giren Dergi) identifier identifier

Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

APPLIED PHYSICS LETTERS, cilt.87, sa.24, 2005 (SCI İndekslerine Giren Dergi) identifier identifier

Power dissipation analysis in tapping-mode atomic force microscopy

PHYSICAL REVIEW B, cilt.67, sa.19, 2003 (SCI İndekslerine Giren Dergi) identifier identifier

Simulations of switching vibrating cantilever in atomic force microscopy

APPLIED SURFACE SCIENCE, cilt.205, ss.86-96, 2003 (SCI İndekslerine Giren Dergi) identifier identifier

Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar

High speed imaging in tapping mode atomic force microscopy

IVC-19/ICSS-15 & ICN+T 2013, Fransa, 9 - 13 Eylül 2013

High speed operating method for tapping mode atomic force microscopes with regular cantilevers

15th International Scanning Probe Microscopy Conference, 30 Haziran - 03 Temmuz 2013

High speed imaging in noncontact atomic force microscopy

Nanotech 2013, Amerika Birleşik Devletleri, 12 - 16 Mayıs 2013, ss.1-4

Evaluation of CMUT Annular Arrays for Side Looking IVUS

2009 IEEE International Ultrasonics Symposium, 19 - 23 Eylül 2009, ss.2774-2777

Optimizing the Driving Scheme of the FIRAT probe for High speed Operation

International Conference on Nanoscience and Technology, Amerika Birleşik Devletleri, 20 - 25 Temmuz 2008

Active Micromachined Probe Structures for Fast Atomic Force Microscopy and Material Property Characterization

Integration and Commercialization of Micro and Nanosystems International Conference & Exhibition, Hong Kong, 3 - 05 Haziran 2008

Analysis of Dual electrode CMUT Designs for Improved Operation and Performance

International Workshop on Mi-cromachined Ultrasonic Transducers, Norveç, 8 - 09 Mayıs 2008

Simulation of Large Signal Operation of Capacitive Micromachined Ultrasonic Transducers

International Workshop on Micromachined Ultra-sonic Transducers, Norveç, 8 - 09 Mayıs 2008

Forward Looking IVUS Imaging Using a Dual Annular Ring CMUT Array Experimental Results

2007 IEEE Ultrasonics Symposium, New York, Amerika Birleşik Devletleri, 28 - 31 Ekim 2007, ss.1247-1250

Design Optimization and Integrated Electronics for Dual Electrode CMUTs

2007 IEEE Ultrasonics Symposium, Amerika Birleşik Devletleri, 28 - 31 Ekim 2007

Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe

International Symposium on Acoustical Imaging, Japonya, 15 - 18 Nisan 2007, cilt.29, ss.215-222

Extracting and Mapping Nanoscale Material PropertieswithTRIF mode using FIRAT probe

International Conference on Nanoscience and Technology, İsviçre, 31 Temmuz - 04 Ağustos 2006

An Active Membrane Based Probe Structure for Tapping Mode Atomic Force Microscope Imaging

International Conference on Nanoscience and Technology, İsviçre, 31 Temmuz - 04 Ağustos 2006

Analysis and Design of Dual Electrode CMUTs

2005 IEEE International Ultrasonics Symposium, Hollanda, 18 - 21 Eylül 2005, ss.581-584

Imaging Material Elasticity with Atomic Force Microscope

Scanning Probe Microscopy, Sensors and Nanostructures, İngiltere, 23 - 26 Mayıs 2003