Publications & Works

Publication Network
Journal articles indexed in SCI, SSCI, and AHCI

Comprehensive study on fabrication, characterization and performance evaluation of Ag/TiOx/ITO and Au/Ag/TiOx/ITO memristors

Saka K., GÖKCEN D., EFKERE H. İ., BAYRAM C., ÖZÇELİK S.
Journal of Materials Science: Materials in Electronics , vol.36, no.14, 2025 (SCI-Expanded) identifier

Multi element (Al plus Cu) doping on ZnO films by ultrasonically spray pyrolysis

Efkere H. İ., Sarica E., Polat Gönüllü M.
PHYSICA B-CONDENSED MATTER , vol.700, 2025 (SCI-Expanded) identifier identifier

Effect of TiO2-Surfactant Interface on the Electrical and Dielectric Properties of a Metal–Insulator–Semiconductor (MIS) Structure

AZIZIAN-KALANDARAGH Y., EFKERE H. İ., Barkhordari A., Marmiroli B., Sartori B., ÖZÇELİK S., et al.
Journal of Electronic Materials , vol.54, no.3, pp.2388-2403, 2025 (SCI-Expanded) identifier identifier

Analysis of Nb-doped and undoped TiO2 nanocoatings with varying dopant concentrations

Arslan Ö., Efkere H. İ., Çokduygulular E., Çetinkaya Ç., İldeş C., Kınacı B.
Journal of Materials Science: Materials in Electronics , vol.36, no.1, 2025 (SCI-Expanded) Creative Commons License identifier

Structural, morphological, optical and electrical characterization of MgO thin films grown by sputtering technique on different substrates

Toprak B. Ç., Efkere H. İ., Aydın S. Ş., Tataroğlu A., Özçelik S.
JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, pp.1-10, 2024 (SCI-Expanded) identifier

Electrical and dielectric behaviors of Al/SiO2-surfactant/n-Si schottky structure in wide range of voltage and frequency

Efkere H. İ., Barkhordari A., Marmiroli B., Sartori B., Özçelik S., Pirgholi-Givi G., et al.
PHYSICA SCRIPTA , vol.99, no.5, pp.1-17, 2024 (SCI-Expanded) identifier

Detailed analysis of the structural, morphological, optical, electrical, and dielectric properties of the reactively produced WO<sub>3</sub> nanostructure

Efkere H. İ., Özçelik S.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.34, no.29, 2023 (SCI-Expanded) identifier identifier

Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage

Kınacı B., Bairam C., Yalcin Y., Cokduygulular E., Çetinkaya Ç., Efkere H. İ., et al.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.13, pp.10516-10523, 2022 (SCI-Expanded) identifier identifier

Investigation of the effect of annealing on the structural, morphological and optical properties of RF sputtered WO3 nanostructure

Efkere H. İ., Gumrukcu A. E., Özen Y., Kinaci B., Aydın S. Ş., Ates H., et al.
PHYSICA B-CONDENSED MATTER , vol.622, 2021 (SCI-Expanded) identifier identifier

Design and fabrication of a semi-transparent solar cell considering the effect of the layer thickness of MoO3/Ag/MoO3 transparent top contact on optical and electrical properties

Çetinkaya Ç., Çokduygulular E., Kınacı B., Güzelçimen F., Özen Y., Efkere H. İ., et al.
Scientific Reports , vol.11, no.1, 2021 (SCI-Expanded) identifier identifier identifier

Evaluation on output parameters of the inverted organic solar cells depending on transition-metal-oxide based hole-transporting materials

Çetinkaya Ç., Çokduygulular E., Kınacı B., Güzelçimen F., Candan İ., Efkere H. İ., et al.
Optical Materials , vol.120, 2021 (SCI-Expanded) identifier identifier

Structural, morphological, optical and electrical properties of the Ti doped-ZnO (TZO) thin film prepared by RF sputter technique

Bairam C., Yalçın Y., EFKERE H. İ., ÇOKDUYGULULAR E., ÇETİNKAYA Ç., Kınacı B., et al.
PHYSICA B-CONDENSED MATTER , vol.616, 2021 (SCI-Expanded) identifier identifier

Investigations of some physical properties of ALD growth ZnO films: effect of crystal orientation on photocatalytic activity

Polat Gönüllü M., Cergel M. S., Efkere H. İ., Ateş H.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.32, no.9, pp.12059-12074, 2021 (SCI-Expanded) identifier identifier

Effect of Annealing on the Surface Morphology and Current-Voltage Characterization of a CZO Structure Prepared by RF Magnetron Sputtering

KINACI B., ÇELİK E. G., ÇOKDUYGULULAR E., ÇETİNKAYA Ç., YALÇIN Y., EFKERE H. İ., et al.
SEMICONDUCTORS , vol.55, no.1, pp.28-36, 2021 (SCI-Expanded) identifier identifier

The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM

Guzelcimen F., Tanoren B., Cetinkaya C., Kaya M., Efkere H. İ., Özen Y., et al.
VACUUM , vol.182, 2020 (SCI-Expanded) identifier identifier

Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer

Cetin S. Ş., Efkere H. İ., Sertel T., Tataroğlu A., Özçelik S.
SILICON , vol.12, no.12, pp.2879-2883, 2020 (SCI-Expanded) identifier identifier

Gas Sensing Properties of Cr Doped TiO2 Films Against Propane

Comert Sertel B., Efkere H. İ., Özçelik S.
IEEE SENSORS JOURNAL , vol.20, pp.13436-13443, 2020 (SCI-Expanded) identifier identifier

Negative capacitance phenomena in Au/SrTiO3/p-Si heterojunction structure

Kınacı B., Çetinkaya Ç., Çokduygulular E., Efkere H. İ., Akın Sönmez N., Özçelik S.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, pp.8718-8726, 2020 (SCI-Expanded) identifier identifier

The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si

Efkere H. İ., Tataroğlu A., Cetin S. Ş., Topaloglu N., Gonullu M., Ateş H.
JOURNAL OF MOLECULAR STRUCTURE , vol.1165, pp.376-380, 2018 (SCI-Expanded) identifier identifier

Efficiency improvement of quantum well solar cell with the AuGeNi metallization and Si3N4 ARC design

Asar T., Baskoese U. C., Kizilkaya K., Efkere H. İ., Ozcelik S.
PHILOSOPHICAL MAGAZINE , vol.95, no.34, pp.3809-3822, 2015 (SCI-Expanded) identifier identifier

Surface structure and photoluminescence properties of AZO thin films on polymer substrates

Akın Sönmez N., Özen Y., Efkere H. İ., Çakmak M., Özçelik S.
SURFACE AND INTERFACE ANALYSIS , vol.47, pp.93-98, 2015 (SCI-Expanded) identifier identifier
Articles Published in Other Journals

Yüksek Sıcaklıkta Tavlanmış Cu Katkılı ZnO (CZO) Arayüzeyli Au/N-Si Yapısının Dielektrik Özelliklerinin Detaylı İncelenmesi

EFKERE H. İ.
Gazi Üniversitesi Fen Fakültesi Dergisi , vol.5, no.1, pp.82-89, 2024 (Peer-Reviewed Journal) identifier

Investigation of Dielectric Properties of Metal/Semiconductor Structure with MoO3 Interface Layer for Low Frequency Values

Özen Y., Efkere H. İ., Asar T., Özçelik S.
Gazi Üniversitesi Fen Fakültesi Dergisi , vol.2, no.1, pp.24-33, 2021 (Peer-Reviewed Journal)

Investigation of the Structural, Morphological, Optical and Electrical Properties of In2O3 Thin Films: Gas Sensor Applications

Asar T., Korkmaz B., Efkere H. İ., Akın Sönmez N., Özçelik S.
JOURNAL OF POLYTECHNIC-POLITEKNIK DERGISI , vol.21, pp.265-271, 2018 (ESCI) Creative Commons License identifier

Structural and Optical Properties of Reactive Sputtered ZnO Thin Films on Flexible-Transparent Substrates

Akın Sönmez N., Başköse Ü. C., Efkere H. İ., Sağlam S., Aydın S. Ş., Özçelik S.
GAZI UNIVERSITY JOURNAL OF SCIENCE , vol.27, no.4, pp.1111-1114, 2014 (Scopus) identifier identifier
Papers Presented at Peer-Reviewed Scientific Conferences

NiO İnce Filmlerin Yapısal ve Optik Özelliklerinin İncelenmesi

Demirbaş E. B., Öcüt B. S., Dicle C. A., Ayağlar M., Efkere H. İ., Aydın S. Ş.
29. Yoğun Madde Fiziği Ankara Toplantısı, Ankara, Turkey, 20 December 2024, pp.31, (Summary Text) Creative Commons License

Rare Earth Oxide CeO2: Preliminary studies on thin films deposited by RF magnetron sputtering for photocatalytic applications

EFKERE H. İ.
International Conference on Advanced Materials Science &amp; Engineering and High Tech Devices Applications; Exhibition (ICMATSE 2024), Ankara, Turkey, 24 - 26 October 2024, (Summary Text)

Flexible Interdigital Ag Electrode Fabrication for UVphotodetectors: A Comparative Study of Aerosol Jet Printing and Thermal Evaporation Methods

Pashaeı P., Serbest B., Akman L. B., Efkere H. İ., Akın Sönmez N., Özçelik S.
4 th International Conference on Light and Light-based Technologies (ICLLT), Ankara, Turkey, 16 - 18 May 2024, vol.1, pp.61, (Summary Text) Creative Commons License

Effect of Hole Transport Layer Thicknesses on Efficiency of CdTe/CdS Solar Cell

Varol B., Efkere H. İ., Özen Y., Aydın S. Ş., Özçelik S.
International Conference on Light and Light-based Technologies (ICLLT-2024), Ankara, Turkey, 16 - 18 May 2024, pp.2, (Summary Text)

Investigation of Optical, Structural and Morphological Properties of Zirconium Oxide Thin Films

Selim Y. N., Toprak B. Ç., Efkere H. İ., Tataroğlu A., Aydın S. Ş., Özçelik S.
International Conference on Light and Light-based Technologies (ICLLT-2024), Ankara, Turkey, 16 - 18 May 2024, pp.3, (Summary Text)

Effect of Buffer Layer Thicknesses on Efficiency of Cadmium Telluride Solar Cell Structures

Ersoy Y., Efkere H. İ., Özen Y., Aydın S. Ş., Özçelik S.
International Conference on Light and Light-based Technologies (ICLLT-2024), Ankara, Turkey, 16 - 18 May 2024, pp.1, (Summary Text)

MgO İnce Filmin Yapısal ve Au/MgO/n-Si Diyotun Elektriksel Özelliklerinin İncelenmesi

Toprak B. Ç., EFKERE H. İ., TATAROĞLU A., AYDIN S. Ş., ÖZÇELİK S.
Yoğun Madde Fiziği – Ankara Toplantısı, Ankara, Turkey, 22 December 2023, (Summary Text)

MgO İnce Filmlerin Optik, Yapısal ve Morfolojik Özelliklerinin İncelenmesi

Toprak B. Ç., EFKERE H. İ., TATAROĞLU A., AYDIN S. Ş., ÖZÇELİK S.
100. Yıl Anısına Yoğun Madde Fiziği Çalıştayı, Ankara, Turkey, 27 October 2023, (Summary Text)

Investigation of the effect of annealing on the structural and optical properties of RF sputtered WO3 nanostructure for memristor applications

Efkere H. İ., Gümrükçü A. E., Özen Y., Kınacı B., Aydın S. Ş., Ateş H., et al.
3nd International Conference on Light and Light-based Technologies (ICLLT), Ankara, Turkey, 25 - 27 May 2022, pp.95, (Summary Text)

Development of IR optical chopper disc by thermal evaporated ZnS thin films

Gümüşay Y. M., Efkere H. İ., Gözlekçi G., Başköse Ü. C., Cömert Sertel B., Dönmez Kaya M., et al.
2nd International Conference on Light and Light-Based Technologies (ICLLT-2), Ankara, Turkey, 26 - 28 May 2021, pp.117, (Summary Text)

Nanostructured TiO2 Layers Thickness Dependence of the Surface Morphology and Acoustic Impedance

Bingöl D., Sirkeci M., Efkere H. İ., Özen Y., Dönmez Kaya M., Tanören B., et al.
Turkish Pyhsics Society, Muğla, Turkey, 4 - 08 September 2019, vol.1, no.1, pp.23-26, (Full Text)

The Effect of Annealing on the Optical and Structural Properties of ZnO Thin Film Deposited on Corning Glass via ALD Technique

Efkere H. İ., Polat Gönüllü M., Özçelik S., Ateş H.
6th Internatıonal conference on materials science and nanotechnology for next generation (MSNG2019), 16 - 18 October 2019, (Summary Text)

Synthesis and Characterization of Al2O3 Thin Film By Using Atomic Layer Deposition

ÇOLAK T., KUPA İ., ÖZKAN Ö. B., ÜNAL Y., EFKERE H. İ., POLAT GÖNÜLLÜ M., et al.
8th International Advanced Technologies Symposium, 19 - 22 October 2017, (Full Text)

InGaAs/GaAs Süperörgü Yapılarının Optik Özelliklerinin Belirlenmesi

Efkere H. İ., Kurtuluş G., Pişkin E., Aydın S. Ş., Asar T., Karaaslan T., et al.
19. Yoğun Madde Fiziği Kongresi, Ankara, Turkey, 20 December 2013, (Summary Text)

n-GaP/Si Yapılarının Büyütülmesi ve Yapısal Analizleri

Pişkin E., Kurtuluş G., Kızılkaya K., Efkere H. İ., Asar T., Aydın S. Ş., et al.
19. Yoğun Madde Fiziği Kongresi, Ankara, Turkey, 20 December 2013, (Summary Text)

Structural and optical properties of RF sputtered AZO thin films on different substrates

Aydın S. Ş., Asar T., Akın Sönmez N., Efkere H. İ., Pişkin E., Başköse Ü. C., et al.
Turkish Physical Society 30th International Physics Congress, İstanbul, Turkey, 02 September 2013, (Summary Text)

Dislocation densities comparison of the graded and ungraded InGaN solar cell structures

Özen Y., Şengüllü S., Kızılkaya K., Kınacı B., Efkere H. İ., Öztürk M. K., et al.
NanoTR-9, Erzurum, Turkey, 24 - 28 June 2013, pp.172, (Summary Text)

MBE tekniği ile büyütülen GaxIn1-xP/GaAs alaşımlarının kritik nokta enerjilerinin spektroskopik elipsometre ile incelenmesi

Aydın S. Ş., Kınacı B., Pişkin E., Efkere H. İ., Memmedli T., Özçelik S.
18. Yoğun Madde Fiziği Kongresi, Ankara, Turkey, 25 November 2011, (Summary Text)
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