Publications & Works

Articles Published in Journals That Entered SCI, SSCI and AHCI Indexes

Photoresponse characteristics of Au/(CoFe2O4-PVP)/n-Si/Au (MPS) diode

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2021 (Journal Indexed in SCI) identifier identifier

A Compare Study on Electrical Properties of MS Diodes with and Without CoFe2O4-PVP Interlayer

JOURNAL OF INORGANIC AND ORGANOMETALLIC POLYMERS AND MATERIALS, vol.31, no.4, pp.1668-1675, 2021 (Journal Indexed in SCI) identifier identifier

The photo-electrical performance of the novel CuAlMnFe shape memory alloy film in the diode application

MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, vol.264, 2021 (Journal Indexed in SCI) identifier identifier

Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol.31, no.22, pp.19846-19851, 2020 (Journal Indexed in SCI) identifier identifier

Electrical and photoresponse properties of CoSO4-PVP interlayer based MPS diodes

Journal of Materials Science: Materials in Electronics, vol.31, no.14, pp.11665-11672, 2020 (Journal Indexed in SCI Expanded) identifier identifier

Electrical properties of Graphene/Silicon structure with Al2O3 interlayer

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol.31, no.12, pp.9719-9725, 2020 (Journal Indexed in SCI) identifier identifier

Electrical characterization of silicon nitride interlayer-based MIS diode

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol.31, no.12, pp.9888-9893, 2020 (Journal Indexed in SCI) identifier identifier

A Temperature Sensor Based on Al/p-Si/CuCdO2/Al Diode for Low Temperature Applications

JOURNAL OF ELECTRONIC MATERIALS, vol.49, no.4, pp.2317-2325, 2020 (Journal Indexed in SCI) identifier identifier

CuAlMnV shape memory alloy thin film based photosensitive diode

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, vol.107, 2020 (Journal Indexed in SCI) identifier identifier

A comparative study on the electrical and dielectric properties of Al/Cd-doped ZnO/p-Si structures

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol.30, no.13, pp.12122-12129, 2019 (Journal Indexed in SCI) identifier identifier

Metallo-Phthalocyanines Based Photocapacitors

SILICON, vol.11, no.3, pp.1275-1286, 2019 (Journal Indexed in SCI) identifier identifier

Double-exponential current–voltage (I–V) and negative capacitance (NC) behavior of Al/(CdSe-PVA)/p-Si/Al (MPS) structure

Journal of Materials Science: Materials in Electronics, vol.30, no.10, pp.9572-9581, 2019 (Journal Indexed in SCI Expanded) identifier identifier

Cu-Al-Mn shape memory alloy based Schottky diode formed on Si

PHYSICA B-CONDENSED MATTER, vol.560, pp.261-266, 2019 (Journal Indexed in SCI) identifier identifier

Analysis of barrier inhomogeneities in AuGe/n-Ge Schottky diode

INDIAN JOURNAL OF PHYSICS, vol.92, no.11, pp.1397-1402, 2018 (Journal Indexed in SCI) identifier identifier

Boron doped graphene based linear dynamic range photodiode

PHYSICA B-CONDENSED MATTER, vol.545, pp.86-93, 2018 (Journal Indexed in SCI) identifier identifier

Analysis of interface states in Au/ZnO/p-InP (MOS) structure

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol.29, no.15, pp.12553-12560, 2018 (Journal Indexed in SCI) identifier identifier

Electronic and optoelectronic properties of Al/coumarin doped Pr2Se3-Tl2Se/p-Si devices

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol.29, no.15, pp.12561-12572, 2018 (Journal Indexed in SCI) identifier identifier

Electrical and impedance properties of MPS structure based on (Cu2O–CuO–PVA) interfacial layer

Journal of Materials Science: Materials in Electronics, vol.29, no.10, pp.8234-8243, 2018 (Journal Indexed in SCI Expanded) identifier identifier

A shape memory alloy based on photodiode for optoelectronic applications

JOURNAL OF ALLOYS AND COMPOUNDS, vol.743, pp.227-233, 2018 (Journal Indexed in SCI) identifier identifier

Electrical characterization of MIS diode prepared by magnetron sputtering

INDIAN JOURNAL OF PURE & APPLIED PHYSICS, vol.56, no.2, pp.142-148, 2018 (Journal Indexed in SCI) identifier identifier

Ruthenium(II) Complex Based Photodiode for Organic Electronic Applications

JOURNAL OF ELECTRONIC MATERIALS, vol.47, no.1, pp.828-833, 2018 (Journal Indexed in SCI) identifier identifier

Electrical Properties of Dilute Nitride GaAsPN/GaPN MQW p-i-n Diode

JOURNAL OF ELECTRONIC MATERIALS, vol.46, no.7, pp.4590-4595, 2017 (Journal Indexed in SCI) identifier identifier

Single crystal ruthenium(II) complex dye based photodiode

DYES AND PIGMENTS, vol.132, pp.64-71, 2016 (Journal Indexed in SCI) identifier identifier

Radiation effects on dielectric properties of MIS structure with Si3N4 thin film prepared by r.f. magnetron sputtering

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.18, pp.798-802, 2016 (Journal Indexed in SCI) identifier identifier

Analysis of density and time constant of interface states of MIS device by conductance method

INDIAN JOURNAL OF PURE & APPLIED PHYSICS, vol.54, no.6, pp.374-378, 2016 (Journal Indexed in SCI) identifier identifier

Photodiode and photocapacitor properties of Au/CdTe/p-Si/Al device

JOURNAL OF ALLOYS AND COMPOUNDS, vol.646, pp.1151-1156, 2015 (Journal Indexed in SCI) identifier identifier

Effects of Temperature on Dielectric Parameters of Metal-Oxide-Semiconductor Capacitor with Thermal Oxide Layer

JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, vol.10, no.5, pp.675-679, 2015 (Journal Indexed in SCI) identifier identifier

Dielectric, conductivity and modulus analysis of AuGe/SiO2/p-Si/AuGe capacitor

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.17, pp.1134-1138, 2015 (Journal Indexed in SCI) identifier identifier

Ferroelectric Bi3.25La0.75Ti3O12 photodiode for solar cell applications

SOLAR ENERGY MATERIALS AND SOLAR CELLS, vol.133, pp.69-75, 2015 (Journal Indexed in SCI) identifier identifier

Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, vol.28, pp.89-93, 2014 (Journal Indexed in SCI) identifier identifier

Analysis of Electrical Characteristics of Metal-Oxide-Semiconductor Capacitor by Impedance Spectroscopy

JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, vol.9, no.4, pp.515-519, 2014 (Journal Indexed in SCI) identifier identifier

Investigation of the effects of gamma-ray irradiation on electrical characteristics of MOS capacitors

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.14, pp.304-308, 2012 (Journal Indexed in SCI) identifier identifier

Influence of frequency on electrical and dielectric properties of Au/Si3N4/n-Si (MIS) structures

Journal of Optoelectronics and Advanced Materials, vol.14, pp.640-645, 2012 (Journal Indexed in SCI Expanded) identifier identifier

Analysis of current-voltage characteristics of Au/n-GaAs (MS) Schottky diodes

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.14, pp.49-54, 2012 (Journal Indexed in SCI) identifier identifier

Frequency and voltage dependence of the electrical and dielectric properties of Au/n-Si Schottky diodes with SiO2 insulator layer

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.13, pp.940-945, 2011 (Journal Indexed in SCI) identifier

The Gaussian distribution of barrier height in Au/n-GaAs Schottky diodes at high temperatures

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, vol.5, pp.438-442, 2011 (Journal Indexed in SCI) identifier identifier

gamma-ray irradiation effects on dielectric properties of Au/SiO2/n-Si (MIS) structures

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, vol.5, pp.443-447, 2011 (Journal Indexed in SCI) identifier identifier

Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.12, no.10, pp.2139-2144, 2010 (Journal Indexed in SCI) identifier

The effects of series resistance on the forward bias I-V characteristics in Au/Bi4Ti3O12/SnO2 (MFM) structures

OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, vol.4, no.5, pp.616-619, 2010 (Journal Indexed in SCI) identifier identifier

Gamma-ray irradiation effects on the interface states of MIS structures

SENSORS AND ACTUATORS A-PHYSICAL, vol.151, no.2, pp.168-172, 2009 (Journal Indexed in SCI) identifier identifier

Characterization of interface states at Au/SnO2/n-Si (MOS) structures

VACUUM, vol.82, no.11, pp.1203-1207, 2008 (Journal Indexed in SCI) identifier identifier

The interface states analysis of the MIS structure as a function of frequency

MICROELECTRONIC ENGINEERING, vol.85, no.3, pp.542-547, 2008 (Journal Indexed in SCI) identifier identifier

Irradiation effect on dielectric properties and electrical conductivity of Au/SiO2/n-Si (MOS) structures

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol.264, no.1, pp.73-78, 2007 (Journal Indexed in SCI Expanded) identifier identifier

Analysis of interface states and series resistance at MIS structure irradiated under Co-60 gamma-rays

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol.580, no.3, pp.1588-1593, 2007 (Journal Indexed in SCI) identifier identifier

Effects of beta-ray irradiation on the C-V and G/ω-V characteristics of Au/SiO2/n-Si (MOS) structures

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol.254, no.2, pp.273-277, 2007 (Journal Indexed in SCI Expanded) identifier identifier

The effects of frequency and gamma-irradiation on the dielectric properties of MIS type Schottky diodes

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol.254, no.1, pp.113-117, 2007 (Journal Indexed in SCI) identifier identifier

Co-60 gamma irradiation effects on the current-voltage (I-V) characteristics of Al/SiO2/P-Si (MIS) Schottky diodes

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol.568, no.2, pp.863-868, 2006 (Journal Indexed in SCI) identifier identifier

Electrical and dielectric properties of MIS Schottky diodes at low temperatures

MICROELECTRONIC ENGINEERING, vol.83, pp.2551-2557, 2006 (Journal Indexed in SCI) identifier identifier

Electrical characteristics of Co-60 gamma-ray irradiated MIS Schottky diodes

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol.252, no.2, pp.257-262, 2006 (Journal Indexed in SCI) identifier identifier

Au/SnO2/n-Si (MOS) structures response to radiation and frequency

MICROELECTRONICS JOURNAL, vol.34, no.11, pp.1043-1049, 2003 (Journal Indexed in SCI) identifier identifier

Articles Published in Other Journals

Metal Oksit Yarıiletken MOS Kapasitörün DielektrikParametrelerinin Frekans ve Sıcaklık Bağımlılığı

Gazi Üniversitesi Fen Bilimleri Dergisi Part: C Tasarım ve Teknoloji, vol.4, no.2, pp.65-70, 2016 (Other Refereed National Journals)

Ulusal Veritabanı ve Atıf İndeksi Kurulumu için Stratejiler, Problemler ve Çözüm Önerileri

Gazi Üniversitesi Fen Bilimleri Dergisi Part C: Tasarım ve Teknoloji, vol.3, no.2, pp.501-512, 2015 (Refereed Journals of Other Institutions)

Ulusal Veritabanı ve Atıf indeksi Kurulumu için Stratejiler Problemler ve Çözüm Önerileri

Gazi Üniversitesi Fen Bilimleri Dergisi Part:C Tasarım ve Teknoloji, vol.3, no.2, pp.501-512, 2015 (Other Refereed National Journals)

Strategies Problems and Solutions for the Development of National Database and Citation Index

Gazi Üniversitesi Fen Bilimleri DergisiPart:C, Tasarım Ve Teknoloji, 2015 (Other Refereed National Journals)

Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C f and G f Measurements

Gazi University Journal of Science, vol.27, pp.909-915, 2014 (Other Refereed National Journals)

Temperature Dependent Electrical Characteristics of Metal Ferroelectric Semiconductor Au SrTiO3 n Si Structures

Journal of Optoelectronics and Advanced Materials - Symposia, vol.1, no.3, pp.266-269, 2009 (Refereed Journals of Other Institutions)

Current Voltage I V and Capacitance Voltage C V Characteristics of Au Bi4Ti3O12 SnO2 Structures

Gazi University Journal of Science, vol.20, pp.97-102, 2007 (Other Refereed National Journals)

Refereed Congress / Symposium Publications in Proceedings

Radiation effects on admittance measurements of MIS capacitor

5th Internatıonal conference on materials science and advanced-nanotechnologies for next generation (MSNG2018), 4 - 06 October 2018

Electrical Properties of MOS Capacitor with TiO2/SiO2 Multilayer Oxide Film

5th International Conference on Materials Science and Nanotechnology For Next Generation (MSNG-2018), Nevşehir, Turkey, 4 - 06 October 2018

Frequency dependence of dielectric properties of Al/N-T Nft/p-Si/Al Structure

INTERNATIONAL CONGRESS ON THE WORLD OF TECHNOLOGY AND ADVANCED MATERIALS, 21 - 23 September 2018

Dielectric Properties of MOS Device Based on TiO2/SiO2 Oxide Layer

Seventh Bozok Science Workshop: Boron and Boron Containing Nanomaterials with Applications, Yozgat, Turkey, 8 - 10 August 2018

Electrical Properties of Dilute Nitride GaAsPN/GaPN MQW p-i-n Diode

Turkish Physical Society 33th International Physics Congress, Muğla, Turkey, 6 - 10 September 2017

The Effect of Thickness on the Optical, Structural and Electrical Properties of ZnO Thin Film Deposited on n-type Si

4th Internatıonal conference on materials science and nanotechnology for next generation (MSNG2017), 28 - 30 June 2017

Temperature dependence of current voltage characteristics of AuGe n Ge AuGe Schottky diode

3st International Nanoscience&Nanotechnology For Next Generation (NANONG2016), 20 - 22 October 2016

Frequency Dependent Dielectric Propertes of Heterogeneous Structure

Turkish Phsical Society 32 nd International Physics Congress, Muğla, Turkey, 6 - 09 September 2016

Frequency Dependent Dielectric Properties of Heterogeneous Structures

Turkish Physical Society 32nd International Physics Congress, 6 - 09 September 2016

Frequency dependent dielectric properties and ac conductivity of Bi3 25La0 75Ti3O12 thin film prepared by sol gel method

2nd International Nanoscience and Nanotechnolgy for Next Generation (NaNoNG) 2015 Conference, ANTALYA/Kemer, Turkey, 29 - 31 October 2015

Metal Oksit Yarıiletken MOS Kapasitörün Dielektrik Karakteristiklerine Sıcaklık Etkisi

20. Yoğun Madde Fiziği Ankara Toplantısı, Hacettepe Üniversitesi, Ankara, Turkey, 26 December 2014

Metal yalıtkan yarıiletken MIS kapasitörün akım gerilim karakteristikleri üzerine gama radyasyon etkileri

21. Yoğun Madde Fiziği Ankara Toplantısı, Gazi Üniversitesi, Ankara, Turkey, 25 December 2015

Dielectric Characteristics of Gamma Irradiated MOS Capacitor

1st International Semiconductor Science and Technology (ISSTC) Conference 2014, İstanbul, Turkey, 13 - 15 January 2014

Frequency Dependent Electrical Characteristics of Ni Au AlGaN AlN GaN Heterostructures

7th BPU General Conference, Alexandroupolis, Greece, 9-13 Sept 2009., Greece, 9 - 13 September 2009

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