SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler
Photoresponse characteristics of Au/(CoFe2O4-PVP)/n-Si/Au (MPS) diode
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.32, sa.12, ss.15732-15739, 2021 (SCI-Expanded)
Complex dielectric permittivity, electric modulus and electrical conductivity analysis of Au/Si3N4/p-GaAs (MOS) capacitor
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.32, sa.9, ss.11418-11425, 2021 (SCI-Expanded)
A Compare Study on Electrical Properties of MS Diodes with and Without CoFe2O4-PVP Interlayer
JOURNAL OF INORGANIC AND ORGANOMETALLIC POLYMERS AND MATERIALS
, cilt.31, sa.4, ss.1668-1675, 2021 (SCI-Expanded)
Frequency dependence of the dielectric properties of Au/(NG:PVP)/n-Si structures
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.32, sa.6, ss.7657-7670, 2021 (SCI-Expanded)
Electrical characterization of Au/n-Si (MS) diode with and without graphene-polyvinylpyrrolidone (Gr-PVP) interface layer
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.32, sa.3, ss.3451-3459, 2021 (SCI-Expanded)
Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.31, sa.22, ss.19846-19851, 2020 (SCI-Expanded)
Electrical and photoresponse properties of CoSO4-PVP interlayer based MPS diodes
Journal of Materials Science: Materials in Electronics
, cilt.31, sa.14, ss.11665-11672, 2020 (SCI-Expanded)
Electrical characterization of silicon nitride interlayer-based MIS diode
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.31, sa.12, ss.9888-9893, 2020 (SCI-Expanded)
Electrical properties of Graphene/Silicon structure with Al2O3 interlayer
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.31, sa.12, ss.9719-9725, 2020 (SCI-Expanded)
A comparative study on the electrical and dielectric properties of Al/Cd-doped ZnO/p-Si structures
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.30, sa.13, ss.12122-12129, 2019 (SCI-Expanded)
Double-exponential current–voltage (I–V) and negative capacitance (NC) behavior of Al/(CdSe-PVA)/p-Si/Al (MPS) structure
Journal of Materials Science: Materials in Electronics
, cilt.30, sa.10, ss.9572-9581, 2019 (SCI-Expanded)
Dielectric, modulus and conductivity studies of Au/PVP/n-Si (MPS) structure in the wide range of frequency and voltage at room temperature
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.30, sa.7, ss.6853-6859, 2019 (SCI-Expanded)
Forward and reverse bias current-voltage (I-V) characteristics in the metal-ferroelectric-semiconductor (Au/SrTiO3/n-Si) structures at room temperature
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.29, sa.19, ss.16740-16746, 2018 (SCI-Expanded)
Analysis of interface states in Au/ZnO/p-InP (MOS) structure
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.29, sa.15, ss.12553-12560, 2018 (SCI-Expanded)
Electronic and optoelectronic properties of Al/coumarin doped Pr2Se3-Tl2Se/p-Si devices
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, cilt.29, sa.15, ss.12561-12572, 2018 (SCI-Expanded)
Electrical and impedance properties of MPS structure based on (Cu2O–CuO–PVA) interfacial layer
Journal of Materials Science: Materials in Electronics
, cilt.29, sa.10, ss.8234-8243, 2018 (SCI-Expanded)
The Gaussian distribution of barrier height in Au/n-GaAs Schottky diodes at high temperatures
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS
, cilt.5, ss.438-442, 2011 (SCI-Expanded)
gamma-ray irradiation effects on dielectric properties of Au/SiO2/n-Si (MIS) structures
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS
, cilt.5, ss.443-447, 2011 (SCI-Expanded)
Temperature and frequency dependent dielectric properties of Au/Bi4Ti3O12/SiO2/Si (MFIS) structures
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
, cilt.12, sa.10, ss.2139-2144, 2010 (SCI-Expanded)
The effects of series resistance on the forward bias I-V characteristics in Au/Bi4Ti3O12/SnO2 (MFM) structures
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS
, cilt.4, sa.5, ss.616-619, 2010 (SCI-Expanded)
Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures
Journal of Optoelectronics and Advanced Materials
, cilt.12, sa.10, ss.2139-2143, 2010 (SCI-Expanded)
Electrical characteristics of Co-60 gamma-ray irradiated MIS Schottky diodes
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
, cilt.252, sa.2, ss.257-262, 2006 (SCI-Expanded)
Diğer Dergilerde Yayınlanan Makaleler
Illumination Response of Impedance Properties of Al/Gr-PVA/p-Si (MPS) Device
Gazi University Journal of Science Part A: Engineering and Innovation
, cilt.10, sa.1, ss.89-96, 2023 (Hakemli Dergi)
Metal Oksit Yarıiletken MOS Kapasitörün DielektrikParametrelerinin Frekans ve Sıcaklık Bağımlılığı
Gazi Üniversitesi Fen Bilimleri Dergisi Part: C Tasarım ve Teknoloji
, cilt.4, sa.2, ss.65-70, 2016 (Hakemli Dergi)
Ulusal Veritabanı ve Atıf İndeksi Kurulumu için Stratejiler, Problemler ve Çözüm Önerileri
Gazi Üniversitesi Fen Bilimleri Dergisi Part C: Tasarım ve Teknoloji
, cilt.3, sa.2, ss.501-512, 2015 (Hakemli Dergi)
Ulusal Veritabanı ve Atıf indeksi Kurulumu için Stratejiler Problemler ve Çözüm Önerileri
Gazi Üniversitesi Fen Bilimleri Dergisi Part:C Tasarım ve Teknoloji
, cilt.3, sa.2, ss.501-512, 2015 (Hakemli Dergi)
Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C f and G f Measurements
Gazi University Journal of Science
, cilt.27, ss.909-915, 2014 (Scopus)
Temperature Dependent Electrical Characteristics of Metal Ferroelectric Semiconductor Au SrTiO3 n Si Structures
Journal of Optoelectronics and Advanced Materials - Symposia
, cilt.1, sa.3, ss.266-269, 2009 (Hakemli Dergi)
Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar
Electrical Properties of MOS Capacitor with TiO2/SiO2 Multilayer Oxide Film
5th International Conference on Materials Science and Nanotechnology For Next Generation (MSNG-2018), Nevşehir, Türkiye, 4 - 06 Ekim 2018
Radiation effects on admittance measurements of MIS capacitor
5th Internatıonal conference on materials science and advanced-nanotechnologies for next generation (MSNG2018), 4 - 06 Ekim 2018
Frequency dependence of dielectric properties of Al/N-T Nft/p-Si/Al Structure
INTERNATIONAL CONGRESS ON THE WORLD OF TECHNOLOGY AND ADVANCED MATERIALS, 21 - 23 Eylül 2018
Dielectric Properties of MOS Device Based on TiO2/SiO2 Oxide Layer
Seventh Bozok Science Workshop: Boron and Boron Containing Nanomaterials with Applications, Yozgat, Türkiye, 8 - 10 Ağustos 2018
Electrical Properties of Dilute Nitride GaAsPN/GaPN MQW p-i-n Diode
Turkish Physical Society 33th International Physics Congress, Muğla, Türkiye, 6 - 10 Eylül 2017
Effect of Thickness on the optical, structural and electrical properties of ZnO Thin Film Deposited on n-type Si
4th International Conference on Materials Science and Nanotecnology for next generation, 28 - 30 Haziran 2017
The Effect of Thickness on the Optical, Structural and Electrical Properties of ZnO Thin Film Deposited on n-type Si
4th Internatıonal conference on materials science and nanotechnology for next generation (MSNG2017), 28 - 30 Haziran 2017
Temperature dependence of current voltage characteristics of AuGe n Ge AuGe Schottky diode
3st International Nanoscience&Nanotechnology For Next Generation (NANONG2016), 20 - 22 Ekim 2016
Frequency Dependent Dielectric Propertes of Heterogeneous Structure
Turkish Phsical Society 32 nd International Physics Congress, Muğla, Türkiye, 6 - 09 Eylül 2016
Frequency dependent dielectric properties and ac conductivity of Bi3 25La0 75Ti3O12 thin film prepared by sol gel method
2nd International Nanoscience and Nanotechnolgy for Next Generation (NaNoNG) 2015 Conference, ANTALYA/Kemer, Türkiye, 29 - 31 Ekim 2015
Metal Oksit Yarıiletken MOS Kapasitörün Dielektrik Karakteristiklerine Sıcaklık Etkisi
20. Yoğun Madde Fiziği Ankara Toplantısı, Hacettepe Üniversitesi, Ankara, Türkiye, 26 Aralık 2014
Metal yalıtkan yarıiletken MIS kapasitörün akım gerilim karakteristikleri üzerine gama radyasyon etkileri
21. Yoğun Madde Fiziği Ankara Toplantısı, Gazi Üniversitesi, Ankara, Türkiye, 25 Aralık 2015
Dielectric Characteristics of Gamma Irradiated MOS Capacitor
1st International Semiconductor Science and Technology (ISSTC) Conference 2014, İstanbul, Türkiye, 13 - 15 Ocak 2014
Frequency Dependent Electrical Characteristics of Ni Au AlGaN AlN GaN Heterostructures
7th BPU General Conference, Alexandroupolis, Greece, 9-13 Sept 2009., Yunanistan, 9 - 13 Eylül 2009
InGaAs/GaAs Çoklu Kuantum Kuyulu Dedektör Yapısının Moleküler Demet Yöntemi ile Büyütülmesi ve Karakterizasyonu
14. Yoğun Madde Fiziği Kongresi, Türkiye, 02 Kasım 2007